Int. J. Microgravity Sci. Appl. 37 (2020), 370202.

Accurate synchrotron hard X-ray diffraction measurements on high-temperature liquid oxides

K. Ohara, Y. Onodera, S. Kohara, C. Koyama, A. Masuno, A. Mizuno, J. T. Okada, S. Tahara, Y. Watanabe, H. Oda, Y. Nakata, H. Tamaru, T. Ishikawa, O. Sakata

10.15011/jasma.37.2.370202