Solution Crystallization Observation Facility (SCOF)

Experiment

A Mach-Zehnder (MZ) interference microscope enables precise measurements of growth conditions. Various options are available.

The SCOF has an amplitude modulation (AM) microscope and is equipped with two wavelength interference microscope to simultaneously measure changes in morphology and growth conditions (temperature and concentration).
Researchers can freely design experiment-unique cartridges. Interfaces for temperature control and measurement, pressure control and measurement, control of the cell stage, evacuation, and N2 gas supply are available. A Michelson interference microscope and Dynamic Light Scattering are also available as options.

Diagnostics

(A) MZ Interference Microscope

The MZ interference microscope employs two wavelength light sources and can simultaneously measure distributions of temperature and concentration in a solution.

(B) AM, Polarizing, and Bright-Field Microscopes

Amplitude modulation (AM), polarizing, and bright-field microscopes can observe crystal shapes, surfaces, etc.

(C) Options

Dynamic Light Scattering
Fluorescence Decay
Reflecting Spectrophotometer
Absorption Photometer
Michelson Interference Microscope

Cell Cartridges

Cell cartridges with standard dimensions of 220 mm in diameter and 65 mm in height are available.
Temperature control (-10 to 220 deg .C), pressure control (1 to 147 MPa), and atmosphere control (vacuum or N2 gas supply) are possible.

Operation

SCOF supports "tele-science" operation by monitoring growing crystals. Experiment parameters can be changed by sending commands from the ground.

Basic Specification

Item	Specifications
Mach-Zehnder Interference Microscope	Magnification	x2, x4
	Light source	LD and solid-state laser diode (λ=532 nm, 780 nm)
	Phase resolution	More than 0.2 λ
	Spatial resolution	More than 3.1 μm (x4), 7 μm (x2)
	CCD image sensor size	1/2 inch
Amplitude Modulation Microscopes	Magnification	x2, x4
	Light source	LED (λ=660 nm)
	Phase difference resolution	More than 0.2 λ
	Spatial resolution	More than 4.2 µm
	Direction of illumination	Transmitted or Refracted (switchable)
	CCD image sensor size	1/2 inch
User Interface	Temperature control	Peltier element (4.2 A Max/ch, 13 A Max/12 ch)
	Temp. Measurement	Thermistor (standard or high-precision measurement), Thermocouple (K, J type)
	Pressure control	1 to 147.1 MPa (Note: Pressurizing hardware will be prepared and designed by user or user integrator)
	Pressure measurement	0 to 147.1 MPa (Precision: ±1 %FS)
	Gas evacuation	101 kPa to 0.13 Pa
	N₂ supplied pressure	0 to 827 kPa
Options	Dynamic Light Scattering. Fluorescence Decay. Reflecting Spectrophotometer. Absorption Photometer. Michelson Interference Microscope.